CVE-2026-33957 (GCVE-0-2026-33957)
Vulnerability from cvelistv5 – Published: 2026-09-14 00:00 – Updated: 2026-09-14 01:40
VLAI
EPSS
VEX
Summary
An issue was discovered in CustOS Driver in Samsung Mobile Processor Exynos 1580. Requesting oversized shared memory from the custos_iwc device enables out-of-bounds read and write, potentially leading to memory corruption or information leakage.
Severity
4.2 (Medium)
CWE
- CWE-787 - Out-of-bounds Write
Assigner
References
Impacted products
1 product
| Vendor | Product | Version | CPE status | |
|---|---|---|---|---|
| Samsung | Exynos 1580 firmware |
Affected:
0 , ≤ 2026-01-07
(custom)
cpe:2.3:a:samsung:exynos_1580_firmware:*:*:*:*:*:*:*:* |
{
"containers": {
"cna": {
"affected": [
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"defaultStatus": "unknown",
"product": "Exynos 1580 firmware",
"vendor": "Samsung",
"versions": [
{
"lessThanOrEqual": "2026-01-07",
"status": "affected",
"version": "0",
"versionType": "custom"
}
]
}
],
"cpeApplicability": [
{
"nodes": [
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"cpeMatch": [
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"criteria": "cpe:2.3:a:samsung:exynos_1580_firmware:*:*:*:*:*:*:*:*",
"versionEndIncluding": "2026-01-07",
"vulnerable": true
}
],
"negate": false,
"operator": "OR"
}
]
}
],
"descriptions": [
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"lang": "en",
"value": "An issue was discovered in CustOS Driver in Samsung Mobile Processor Exynos 1580. Requesting oversized shared memory from the custos_iwc device enables out-of-bounds read and write, potentially leading to memory corruption or information leakage."
}
],
"metrics": [
{
"cvssV3_1": {
"attackComplexity": "HIGH",
"attackVector": "LOCAL",
"availabilityImpact": "LOW",
"baseScore": 4.2,
"baseSeverity": "MEDIUM",
"confidentialityImpact": "LOW",
"integrityImpact": "NONE",
"privilegesRequired": "LOW",
"scope": "CHANGED",
"userInteraction": "NONE",
"vectorString": "CVSS:3.1/AV:L/AC:H/PR:L/UI:N/S:C/C:L/I:N/A:L",
"version": "3.1"
},
"format": "CVSS",
"scenarios": [
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"lang": "en",
"value": "GENERAL"
}
]
}
],
"problemTypes": [
{
"descriptions": [
{
"cweId": "CWE-787",
"description": "CWE-787 Out-of-bounds Write",
"lang": "en",
"type": "CWE"
}
]
}
],
"providerMetadata": {
"dateUpdated": "2026-09-14T01:40:18.634Z",
"orgId": "8254265b-2729-46b6-b9e3-3dfca2d5bfca",
"shortName": "mitre"
},
"references": [
{
"url": "https://semiconductor.samsung.com/support/quality-support/product-security-updates/"
},
{
"url": "https://semiconductor.samsung.com/support/quality-support/product-security-updates/cve-2026-33957/"
}
],
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"cveMetadata": {
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"assignerShortName": "mitre",
"cveId": "CVE-2026-33957",
"datePublished": "2026-09-14T00:00:00.000Z",
"dateReserved": "2026-03-24T00:00:00.000Z",
"dateUpdated": "2026-09-14T01:40:18.634Z",
"state": "PUBLISHED"
},
"dataType": "CVE_RECORD",
"dataVersion": "5.2"
}
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Experimental. This forecast is provided for visualization only and may change without notice. Do not use it for operational decisions.
Forecast uses a logistic model when the trend is rising, or an exponential decay model when the trend is falling. Fitted via linearized least squares.
Sightings
| Author | Source | Type | Date | Other |
|---|
Nomenclature
- Seen: The vulnerability was mentioned, discussed, or observed by the user.
- Confirmed: The vulnerability has been validated from an analyst's perspective.
- Published Proof of Concept: A public proof of concept is available for this vulnerability.
- Exploited: The vulnerability was observed as exploited by the user who reported the sighting.
- Patched: The vulnerability was observed as successfully patched by the user who reported the sighting.
- Not exploited: The vulnerability was not observed as exploited by the user who reported the sighting.
- Not confirmed: The user expressed doubt about the validity of the vulnerability.
- Not patched: The vulnerability was not observed as successfully patched by the user who reported the sighting.
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The MITRE ATT&CK techniques below are AI-generated suggestions, inferred from the description of the
vulnerability by the CIRCL/vulnerability-attack-technique-classification-roberta-base
model, served locally by ML-Gateway.
They have not been verified by an analyst and are provided for guidance only.
The approach is described in our paper Mapping CVEs to MITRE ATT&CK Techniques: A Curated Gold-Set Classifier and the Limits of LLM-Assisted Label Expansion.
The approach is described in our paper Mapping CVEs to MITRE ATT&CK Techniques: A Curated Gold-Set Classifier and the Limits of LLM-Assisted Label Expansion.
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