CNVD-2018-26772
Vulnerability from cnvd - Published: 2018-12-27
VLAI
Title
VIA Technologies EPIA-E900系统主板ETK_E900.sys SmartETK驱动程序拒绝服务漏洞
Description
VIA Technologies EPIA-E900 system board是威盛电子(VIA Technologies)公司的一款嵌入式Pico-ITX主板。ETK_E900.sys SmartETK driver是其中的一个驱动程序。
VIA Technologies EPIA-E900系统主板的ETK_E900.sys SmartETK驱动程序中存在拒绝服务漏洞,攻击者可利用该漏洞造成拒绝服务。
Severity
中
Formal description
厂商尚未提供漏洞修复方案,请关注厂商主页更新: https://www.viatech.com/
Reference
https://downwithup.github.io/CVEPosts.html
Impacted products
| Name | VIA Technologies ETK_E900.sys SmartETK(for EPIA-E900) |
|---|
{
"cves": {
"cve": {
"cveNumber": "CVE-2018-20404"
}
},
"description": "VIA Technologies EPIA-E900 system board\u662f\u5a01\u76db\u7535\u5b50\uff08VIA Technologies\uff09\u516c\u53f8\u7684\u4e00\u6b3e\u5d4c\u5165\u5f0fPico-ITX\u4e3b\u677f\u3002ETK_E900.sys SmartETK driver\u662f\u5176\u4e2d\u7684\u4e00\u4e2a\u9a71\u52a8\u7a0b\u5e8f\u3002\n\nVIA Technologies EPIA-E900\u7cfb\u7edf\u4e3b\u677f\u7684ETK_E900.sys SmartETK\u9a71\u52a8\u7a0b\u5e8f\u4e2d\u5b58\u5728\u62d2\u7edd\u670d\u52a1\u6f0f\u6d1e\uff0c\u653b\u51fb\u8005\u53ef\u5229\u7528\u8be5\u6f0f\u6d1e\u9020\u6210\u62d2\u7edd\u670d\u52a1\u3002",
"discovererName": "unknown",
"formalWay": "\u5382\u5546\u5c1a\u672a\u63d0\u4f9b\u6f0f\u6d1e\u4fee\u590d\u65b9\u6848\uff0c\u8bf7\u5173\u6ce8\u5382\u5546\u4e3b\u9875\u66f4\u65b0\uff1a\r\nhttps://www.viatech.com/",
"isEvent": "\u901a\u7528\u8f6f\u786c\u4ef6\u6f0f\u6d1e",
"number": "CNVD-2018-26772",
"openTime": "2018-12-27",
"products": {
"product": "VIA Technologies ETK_E900.sys SmartETK\uff08for EPIA-E900\uff09"
},
"referenceLink": "https://downwithup.github.io/CVEPosts.html",
"serverity": "\u4e2d",
"submitTime": "2018-12-27",
"title": "VIA Technologies EPIA-E900\u7cfb\u7edf\u4e3b\u677fETK_E900.sys SmartETK\u9a71\u52a8\u7a0b\u5e8f\u62d2\u7edd\u670d\u52a1\u6f0f\u6d1e"
}
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Experimental. This forecast is provided for visualization only and may change without notice. Do not use it for operational decisions.
Forecast uses a logistic model when the trend is rising, or an exponential decay model when the trend is falling. Fitted via linearized least squares.
Sightings
| Author | Source | Type | Date | Other |
|---|
Nomenclature
- Seen: The vulnerability was mentioned, discussed, or observed by the user.
- Confirmed: The vulnerability has been validated from an analyst's perspective.
- Published Proof of Concept: A public proof of concept is available for this vulnerability.
- Exploited: The vulnerability was observed as exploited by the user who reported the sighting.
- Patched: The vulnerability was observed as successfully patched by the user who reported the sighting.
- Not exploited: The vulnerability was not observed as exploited by the user who reported the sighting.
- Not confirmed: The user expressed doubt about the validity of the vulnerability.
- Not patched: The vulnerability was not observed as successfully patched by the user who reported the sighting.
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The MITRE ATT&CK techniques below are AI-generated suggestions, inferred from the description of the
vulnerability by the CIRCL/vulnerability-attack-technique-classification-roberta-base
model, served locally by ML-Gateway.
They have not been verified by an analyst and are provided for guidance only.
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