FKIE_CVE-2015-7895
Vulnerability from fkie_nvd - Published: 2017-06-27 20:29 - Updated: 2026-06-17 00:33
Severity
Summary
Samsung Gallery on the Samsung Galaxy S6 allows local users to cause a denial of service (process crash).
References
Impacted products
| Vendor | Product | Version | |
|---|---|---|---|
| samsung | samsung_mobile | * | |
| samsung | galaxy_s6 | - |
{
"affected": [
{
"affectedData": [
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"product": "n/a",
"vendor": "n/a",
"versions": [
{
"status": "affected",
"version": "n/a"
}
]
}
],
"source": "cve@mitre.org"
}
],
"configurations": [
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"criteria": "cpe:2.3:o:samsung:samsung_mobile:*:*:*:*:*:*:*:*",
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"cveTags": [],
"descriptions": [
{
"lang": "en",
"value": "Samsung Gallery on the Samsung Galaxy S6 allows local users to cause a denial of service (process crash)."
},
{
"lang": "es",
"value": "Samsung Gallery de Samsusng Galaxy S6 permite a los usuarios locales provocar una denegaci\u00f3n de servicio (ca\u00edda del proceso)."
}
],
"id": "CVE-2015-7895",
"lastModified": "2026-06-17T00:33:20.867",
"metrics": {
"cvssMetricV2": [
{
"acInsufInfo": false,
"baseSeverity": "LOW",
"cvssData": {
"accessComplexity": "LOW",
"accessVector": "LOCAL",
"authentication": "NONE",
"availabilityImpact": "PARTIAL",
"baseScore": 2.1,
"confidentialityImpact": "NONE",
"integrityImpact": "NONE",
"vectorString": "AV:L/AC:L/Au:N/C:N/I:N/A:P",
"version": "2.0"
},
"exploitabilityScore": 3.9,
"impactScore": 2.9,
"obtainAllPrivilege": false,
"obtainOtherPrivilege": false,
"obtainUserPrivilege": false,
"source": "nvd@nist.gov",
"type": "Primary",
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}
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"attackVector": "LOCAL",
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"integrityImpact": "NONE",
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"scope": "UNCHANGED",
"userInteraction": "NONE",
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"published": "2017-06-27T20:29:00.697",
"references": [
{
"source": "cve@mitre.org",
"tags": [
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],
"url": "http://packetstormsecurity.com/files/134950/Samsung-Galaxy-S6-Samsung-Gallery-Bitmap-Decoding-Crash.html"
},
{
"source": "cve@mitre.org",
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"url": "http://www.securityfocus.com/bid/77429"
},
{
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"tags": [
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"url": "https://bugs.chromium.org/p/project-zero/issues/detail?id=497\u0026redir=1"
},
{
"source": "cve@mitre.org",
"tags": [
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"url": "https://googleprojectzero.blogspot.ie/2015/11/hack-galaxy-hunting-bugs-in-samsung.html"
},
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{
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"tags": [
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"url": "https://www.exploit-db.com/exploits/38613/"
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],
"sourceIdentifier": "cve@mitre.org",
"vulnStatus": "Modified",
"weaknesses": [
{
"description": [
{
"lang": "en",
"value": "CWE-284"
}
],
"source": "nvd@nist.gov",
"type": "Primary"
}
]
}
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Experimental. This forecast is provided for visualization only and may change without notice. Do not use it for operational decisions.
Forecast uses a logistic model when the trend is rising, or an exponential decay model when the trend is falling. Fitted via linearized least squares.
Sightings
| Author | Source | Type | Date | Other |
|---|
Nomenclature
- Seen: The vulnerability was mentioned, discussed, or observed by the user.
- Confirmed: The vulnerability has been validated from an analyst's perspective.
- Published Proof of Concept: A public proof of concept is available for this vulnerability.
- Exploited: The vulnerability was observed as exploited by the user who reported the sighting.
- Patched: The vulnerability was observed as successfully patched by the user who reported the sighting.
- Not exploited: The vulnerability was not observed as exploited by the user who reported the sighting.
- Not confirmed: The user expressed doubt about the validity of the vulnerability.
- Not patched: The vulnerability was not observed as successfully patched by the user who reported the sighting.
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The MITRE ATT&CK techniques below are AI-generated suggestions, inferred from the description of the
vulnerability by the CIRCL/vulnerability-attack-technique-classification-roberta-base
model, served locally by ML-Gateway.
They have not been verified by an analyst and are provided for guidance only.
The approach is described in our paper Mapping CVEs to MITRE ATT&CK Techniques: A Curated Gold-Set Classifier and the Limits of LLM-Assisted Label Expansion.
Browse all ATT&CK techniques and the vulnerabilities related to each.
The approach is described in our paper Mapping CVEs to MITRE ATT&CK Techniques: A Curated Gold-Set Classifier and the Limits of LLM-Assisted Label Expansion.
Browse all ATT&CK techniques and the vulnerabilities related to each.
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Related by attack behaviour
Vulnerabilities whose description is nearest to this one in the vector space of the CIRCL/vulnerability-attack-technique-biencoder model. This is a similarity search over the bi-encoder space (plain cosine), not a classification, and it has no measured accuracy.
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