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GHSA-XH3J-M8P6-2HJH

Vulnerability from github – Published: 2025-08-08 18:32 – Updated: 2025-08-08 18:32
VLAI
Details

The affected product does not limit the number of attempts for inputting the correct PIN for a registered product, which may allow an attacker to gain unauthorized access using brute-force methods if they possess a valid device serial number. The API provides clear feedback when the correct PIN is entered. This vulnerability was patched in a server-side update on April 6, 2025.

Show details on source website

{
  "affected": [],
  "aliases": [
    "CVE-2025-46414"
  ],
  "database_specific": {
    "cwe_ids": [
      "CWE-307"
    ],
    "github_reviewed": false,
    "github_reviewed_at": null,
    "nvd_published_at": "2025-08-08T17:15:28Z",
    "severity": "CRITICAL"
  },
  "details": "The affected product does not limit the number of attempts for inputting\n the correct PIN for a registered product, which may allow an attacker \nto gain unauthorized access using brute-force methods if they possess a \nvalid device serial number. The API provides clear feedback when the \ncorrect PIN is entered. This vulnerability was patched in a server-side \nupdate on April 6, 2025.",
  "id": "GHSA-xh3j-m8p6-2hjh",
  "modified": "2025-08-08T18:32:22Z",
  "published": "2025-08-08T18:32:22Z",
  "references": [
    {
      "type": "ADVISORY",
      "url": "https://nvd.nist.gov/vuln/detail/CVE-2025-46414"
    },
    {
      "type": "WEB",
      "url": "https://eg4electronics.com/contact"
    },
    {
      "type": "WEB",
      "url": "https://www.cisa.gov/news-events/ics-advisories/icsa-25-219-07"
    }
  ],
  "schema_version": "1.4.0",
  "severity": [
    {
      "score": "CVSS:3.1/AV:N/AC:H/PR:N/UI:N/S:U/C:H/I:H/A:H",
      "type": "CVSS_V3"
    },
    {
      "score": "CVSS:4.0/AV:N/AC:H/AT:N/PR:N/UI:N/VC:H/VI:H/VA:H/SC:N/SI:N/SA:N/E:X/CR:X/IR:X/AR:X/MAV:X/MAC:X/MAT:X/MPR:X/MUI:X/MVC:X/MVI:X/MVA:X/MSC:X/MSI:X/MSA:X/S:X/AU:X/R:X/V:X/RE:X/U:X",
      "type": "CVSS_V4"
    }
  ]
}



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Forecast uses a logistic model when the trend is rising, or an exponential decay model when the trend is falling. Fitted via linearized least squares.

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Nomenclature

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